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| Scratch-dig comparator |
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Description:
With these wide l0 X comparators, it will not be necessary to guess over blemish sizes. Each unit can be adjusted to the eye of the user for maximum sharpness of image and minimum eyestrain. Simply focus the eyepiece on the reticle and hold the comparator in close proximity to the item being inspected. The depth of field of the achromatic eyepiece will bring the test item into focus without the need for actual physical contact with the work. The large reticles show scratch increments of 10, 20, 40, 60 and 80, and dig increments of 5, 10, 20, 40 and 50. |
Scratch number indicates width of scratch in microns. Tolerances for scratch widths are:
#10 = 10 +/- 0.5µ
#20 = 20 +/- 2.0µ
#40 = 40 +/- 4.0µ
#60 = 60 +/- 6.0µ
#80 = 80 +/- 8.0µ
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Dig defect numbers represent the mean dig diameter in 1/100 of a millimeter.
Tolerances for dig diameter are:
#5 = +/- 0.00206 mm
#10 = +/- 0.00413 mm
#20 = +/- 0.00817 mm
#40 = +/- 0.01614 mm
#50 = +/- 0.02015 mm |
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Control Optics USA
Address:1445 W Brooks St., Ste H, Ontario, Ca 91762
For sales please contact:
Dr. Norman (Waimin) Liu
Tel: 909.983.0788 Cell: 909.525.8666
Fax: 909.983.0791
Email: Waimin_Liu@Yahoo.com
controloptics@yahoo.com
Control Optics HongKong
Products:Yamamoto Laser eye Protection,
Scratch-Dig comparator
Collimation Tester.
Services area: Hong Kong, Taiwan, South Asia
Contacts inf.
Mr. Ying Biu Lam
Cell: +852.930.10593
Email:YBLam2001@Yahoo.com
Contacts in Shanghai:
Services area : China
Products served: Optical instrument, Yamamoto Laser eye protection
Scratch-Dig comparator
Contact information:
Prof. Jinwen Su
Cell: 86- 13916719148
Email: Jinwensu@yahoo.com
Control Optics USA
Address: 1445 W Brooks St., Ste H, Ontario, Ca 91762
For sales please contact:
Shukee Chau
Tel: 909.983.0788
Fax: 909.983.0791
Email: shukee@controloptics.com
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