|
|
 |
| |
Products
> photonics
> Scratch-Dig comparator |
|
| |
|
|
| |
|
With
these wide l0 X comparators, it will not be necessary to guess
over blemish sizes. Each unit can be adjusted to the eye of
the user for maximum sharpness of image and minimum eyestrain.
Simply focus the eyepiece on the reticle and hold the comparator
in close proximity to the item being inspected. The depth
of field of the achromatic eyepiece will bring the test item
into focus without the need for actual physical contact with
the work. The large reticles show Scratch increments of 10,
20, 40, 60 and 80, and Dig increments of 5, 10, 20, 40 and
50. Scratch
number indicates width of scratch in microns. Tolerances
for scratch widths are:
#10 = 10 +/-
0.5u
#20 = 20 +/- 2.0u
#40 = 40 +/- 4.0u
#60 = 60 +/- 6.0u
#80 = 80 +/- 8.0u |
DS-300
Comparator System DS-300-1
Replacement reticle-Scratch
DS-300-2
Replacement reticle-Dig |
Dig defect numbers represent the mean dig diameter in 1/100 of a millimeter.
Tolerances for dig diameter are:
#5 = +/- 0.00206 mm
#10 = +/- 0.00413 mm
#20 = +/- 0.00817 mm
#40 = +/- 0.01614 mm
#50 = +/- 0.02015 mm
|
|
|
|
